An X-ray Interferometer Made from Normal Incidence X-ray Optics

Narrow Bandpass Multilayer Coated Diffraction Limited Optics Developed for EUV Lithography can be used to make a soft X-ray Interferometer.

Some Papers:

• D. L. Windt, S. M. Kahn, G. E. Sommargren, Proc. SPIE, 4851, 441 (2002) (http://www.rxollc.com/windt/papers/2002_SPIE_4851_NIML.pdf)
• D. L. Windt, S. M. Kahn, and G. E. Sommargren, BAAS, 34, 744 (2002) (http://www.rxollc.com/windt/papers/2002_BAAS_34_744.pdf)